ELECTRON MICROSCOPY

Sample

CCL19-CCR7-Gi-scFv16

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 256195
Reported Resolution (Å) 3.0
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value 60
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 50
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model JEOL CRYO ARM 300
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 1800
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 3.4
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification 63291
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details The microscope model is the JEOL's "JEM-Z320FHC", a custom-built model of JEOL CRYO ARM 300.
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 4.7
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION cryoSPARC 4.7
MODEL FITTING Coot 0.9.8.96 EL
MODEL REFINEMENT PHENIX 1.21.1_5286
INITIAL EULER ASSIGNMENT cryoSPARC 4.7
FINAL EULER ASSIGNMENT cryoSPARC 4.7
CLASSIFICATION cryoSPARC 4.7
RECONSTRUCTION cryoSPARC 4.7
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION CryoSPARC patch CTF estimation and global/local CTF refinements
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