X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 0.02M Sodium formate, 0.02M Ammonium acetate, 0.02M Sodium citrate tribasic dihydrate, 0.02M Potassium sodium tartrate tetrahydrate, 0.02M Sodium oxamate, 0.039M Bicine, 0.061M Tris base, 20% v/v Ethylene glycol, 10% w/v PEG 8000
Unit Cell:
a: 210.28 Å b: 210.28 Å c: 110.865 Å α: 90° β: 90° γ: 120°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 4.56 Solvent Content: 73.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.9 34.86 28691 1438 88.45 0.2057 0.2428 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.90 34.86 100 ? 0.08 10.5 40.7 ? 29842 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 3.00 100 ? 0.81 1.4 42.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 0.920 NSLS-II 17-ID-1
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874: ???
autoPROC data processing 1.0.5
XDS data reduction un 30, 2024 (BUILT 20241002)
pointless data scaling 1.12.14
Aimless data scaling 0.7.9
PHASER phasing 2.8.3
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