X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 27% (w/v) PEG3350, 0.1 M MES pH 6.3, 0.2 M potassium iodide
Unit Cell:
a: 48.053 Å b: 49.480 Å c: 57.202 Å α: 81.700° β: 87.840° γ: 61.410°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.61 Solvent Content: 52.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.9500 43.0300 30552 1701 96.6100 0.1931 0.2345 41.9640
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 43.03 96.600 0.084 ? 17.800 7.100 ? 32254 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.950 2.000 88.700 ? ? ? 7.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-5A 1.0717 Photon Factory BL-5A
Software
Software Name Purpose Version
REFMAC refinement 5.8.0258
XDS data reduction .
Aimless data scaling 0.7.4
PDB_EXTRACT data extraction 3.25
HKL2Map phasing .
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