X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 292 PEG 10000, ethylene glycol
Unit Cell:
a: 146.120 Å b: 146.120 Å c: 146.120 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 3
Crystal Properties:
Matthew's Coefficient: 3.46 Solvent Content: 64.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 39. 30065 1248 99.03 0.1836 0.2091 60.42
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 39 99.6 ? 0.043 25.5 6.6 ? 30067 0 -3 46.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 0.97950 SSRL BL12-2
Software
Software Name Purpose Version
BUSTER refinement 2.11.4
XDS data reduction .
SCALA data scaling .
PHASER phasing .
Feedback Form
Name
Email
Institute
Feedback