X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 HEPES, PEG 4000, NaOAc
Unit Cell:
a: 55.640 Å b: 115.850 Å c: 66.090 Å α: 90.000° β: 101.350° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.72 Solvent Content: 54.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.5300 43.1850 121558 6079 98.5700 0.1646 0.1879 27.8439
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.530 50 98.500 ? ? 18.760 4.2 ? 121606 ? ? 20.750
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.530 1.630 98.400 ? ? 2.790 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PETRA III, EMBL c/o DESY BEAMLINE P13 (MX1) 0.920 PETRA III, EMBL c/o DESY P13 (MX1)
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling 2.5.2
X-PLOR model building .
PDB_EXTRACT data extraction 3.14
PHASER phasing .
PHENIX refinement (phenix.refine: 1.9_1690)
XSCALE data reduction .
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