X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 1 microliter of DHX8del550 at 3 mg/mL with 1 mM ADP and 1 mM MgCl2, plus 0.5 microliter of a crystallisation solution consisting of 18% (w/v) PEG 6000, 0.1 M CaCl2, 0.1 M Tris/HCl pH 8.5.
Unit Cell:
a: 145.681 Å b: 71.013 Å c: 90.344 Å α: 90.000° β: 121.830° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: 37.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5000 44.9100 27012 1336 98.8000 0.2142 0.2524 55.5500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 44.910 99.000 0.180 ? 6.100 4.200 ? 27019 ? ? 60.600
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.600 99.100 ? ? ? 4.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.0000 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.8.2
PHASER phasing .
BUSTER refinement 2.10.4 (26-JUL-2023)
PDB_EXTRACT data extraction 3.28
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