ELECTRON MICROSCOPY

Sample

native flagellar filament

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 176558
Reported Resolution (Å) 3.5
Resolution Method FSC 0.143 CUT-OFF
Other Details Further Density Modification with Phenix Resolve increased resolution to 3.2 angstroems and better resolved features in the cryoEM map
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space RECIPROCAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details iteration between real space refinement with Phenix.real_space_refine, and Servalcat (reciprocal space)
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 25.7
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 1500
Maximum Defocus (nm) 2600
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC ?
MODEL FITTING Coot 1.1.19
MODEL FITTING UCSF ChimeraX 1.10.1
MODEL REFINEMENT PHENIX 2.0-5936
MODEL REFINEMENT Servalcat 0.4.128
INITIAL EULER ASSIGNMENT cryoSPARC ?
FINAL EULER ASSIGNMENT cryoSPARC ?
RECONSTRUCTION cryoSPARC 4.2.1
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?
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