X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.5 291.15 0.1 M CAPS pH 10.5, 0.2 M lithium sulfate, 2 M ammonium sulfate
Unit Cell:
a: 54.068 Å b: 58.150 Å c: 88.164 Å α: 90.161° β: 101.691° γ: 92.115°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.8 Solvent Content: 56.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.08 27.75 57276 2801 90.93 0.1757 0.2267 18.33
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.08 86 91 ? ? 3.9 1.7 ? 57344 ? ? 15.35
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.08 2.19 ? ? ? ? 1.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 193.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL02U1 0.9792 SSRF BL02U1
Software
Software Name Purpose Version
PHENIX refinement 1.15.2_3472
HKL-3000 data reduction .
HKL-3000 data scaling .
PHASER phasing .
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