ISDA: 5BP4

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.0	277.15	Crystallization condition: 0.052 M MgCl2, 0.052 M CaCl2, 5.88% (w/v) PEG 3350, 20 % (v/v) ethylene glycol, 0.05 M MES pH 7.0 Protein/buffer: 20.3 mg/ml protein, 1.5 mM NADP+, 0.02 mM HEPES pH 7.4, 0.25 M NaCl, 5 % (v/v) Glycerol, 0.005 M DTT. Seeding

Unit Cell:

a: 151.380 Å b: 190.370 Å c: 270.840 Å α: 95.58° β: 91.92° γ: 103.65°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 3.04 Solvent Content: 59.51

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	3.75	78.62	296153	2985	98.96	0.2299	0.2401	171.34

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.75	78.62	99.9	0.25	?	8.95	9.0	?	296164	?	?	132.22

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.75	3.85	98.9	?	?	?	9.26	21835

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X06SA	0.97626	SLS	X06SA

Software