X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 sead bead method. Initial crystals sitting drop, 20% PEG400, 16% PEG4000, 70mM MgCl, 100mM Tris8.5 seed crystals hangig drop, 20%PEG400, 16%PEG4000, 50mM MgCl, 100mM Tris8.5
Unit Cell:
a: 53.070 Å b: 115.840 Å c: 83.030 Å α: 90.000° β: 90.032° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.1 Solvent Content: 42.71
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.71 48.25 13482 1347 98.19 0.2578 0.2992 72.76
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.71 48.25 98.28 ? ? 13.47 6.5 ? 13514 ? ? 63.47
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.71 2.807 95.77 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.0 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
PHENIX refinement 1.19.2_4158
XDS data reduction .
XSCALE data scaling .
PHENIX phasing .
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