ELECTRON MICROSCOPY

Sample

ClpP tetradecamer

Specimen Preperation
Sample Aggregation State 3D ARRAY
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 39438
Reported Resolution (Å) 3.07
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 45
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS GLACIOS
Minimum Defocus (nm) 400
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION 9.03
MODEL REFINEMENT PHENIX 1.19.2_4158
RECONSTRUCTION RELION 9.03
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?
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