X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6 293 1mM ATP 1mM MgCl2 4.5 % (w/v) PEG4000 50 mM MES pH 6 100 mM MgCl2 100 mM NaCl 25 mM Hepes pH 8
Unit Cell:
a: 190.187 Å b: 190.187 Å c: 60.455 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 6
Crystal Properties:
Matthew's Coefficient: 2.64 Solvent Content: 53.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.892 47.547 99843 1167 99.92 0.1846 0.2124 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.892 48 100 ? ? 10.6 10.4 ? 99891 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.892 2.0 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.0332 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement (1.14_3211: ???)
XDS data reduction .
XDS data scaling .
PHASER phasing .
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